发明名称 METHOD FOR FORMING OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To solve a problem of a crack which is produced when an oxide film is formed at an ambient pressure or a pressure close to the ambient pressure; and thereby to provide a method for forming an oxide film having superior insulation characteristics and high productivity. SOLUTION: The method for forming the oxide film on a substrate by using an ambient pressure plasma CVD technique includes repeating the step (A) of supplying a gas of an organometallic compound containing a metallic component of the oxide film and a working gas mainly containing oxygen which generates plasma and becomes a film component, and the step (B) of stopping supplying the gas of the organometallic compound and supplying only the working gas. The method for forming the oxide film can control an amount of C in the oxide film formed on the substrate into 2% or less by atomic weight, by repeating the step (A) and the step (B). COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007113031(A) 申请公布日期 2007.05.10
申请号 JP20050303133 申请日期 2005.10.18
申请人 HITACHI METALS LTD 发明人 OISHI KATSUHIKO
分类号 C23C16/455;C01B13/20;C23C16/40;C23C16/42 主分类号 C23C16/455
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