METHOD AND DEVICE FOR MEASURING MICROCRYSTAL GRAIN ORIENTATION DISTRIBUTION

摘要

A method for measuring orientation distribution in which the orientation distribution of microcrystal grains continuously supplied from a manufacturing process can be examined inline or online and a device therefore are provided. An X-ray beam is monochromatized and directed to the surface of a measurement sample (microcrystal grains in a YBCO film (layer))(S) grown on a metal tape (MT) with a predetermined angular width centering the Bragg angle. The diffraction image of the applied X-rays is integrated with a two-dimensional X-ray detector (200) located in its diffraction direction to obtain a pole figure. With the spread in at least one direction ( ? ? direction) as an index out of the spreads in two directions in the obtained pole figure, an orientation distribution measurement of the sample microcrystal grains which are continuously transferred is carried out inline or online.