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发明名称
SEMICONDUCTOR MEMORY APPARATUS AND METHOD FOR TESTING THE SAME
摘要
申请公布号
KR100718042(B1)
申请公布日期
2007.05.08
申请号
KR20060031617
申请日期
2006.04.06
申请人
HYNIX SEMICONDUCTOR INC.
发明人
CHUN, JUN HYUN
分类号
G11C29/00
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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