发明名称 |
MOIRE INTERFEROMETRIC STRAIN SENSOR |
摘要 |
<p>A moiré interferometric strain sensor for detecting strain on a specimen, a diffraction grating being on the specimen, the strain sensor including an array of a plurality of microlenses for receiving at least one reflected beam of at least one incident beam upon the specimen; and a detector array at a focal plane of the array of a plurality of microlenses.</p> |
申请公布号 |
SG131080(A1) |
申请公布日期 |
2007.04.26 |
申请号 |
SG20060065577 |
申请日期 |
2006.09.26 |
申请人 |
NANYANG TECHNOLOGICAL UNIVERSITY |
发明人 |
ASUNDI ANAND KRISHNA;PRIYADARSHI ANISH;MHAISALKAR SUBODH GAUTAM |
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