发明名称 MOIRE INTERFEROMETRIC STRAIN SENSOR
摘要 <p>A moiré interferometric strain sensor for detecting strain on a specimen, a diffraction grating being on the specimen, the strain sensor including an array of a plurality of microlenses for receiving at least one reflected beam of at least one incident beam upon the specimen; and a detector array at a focal plane of the array of a plurality of microlenses.</p>
申请公布号 SG131080(A1) 申请公布日期 2007.04.26
申请号 SG20060065577 申请日期 2006.09.26
申请人 NANYANG TECHNOLOGICAL UNIVERSITY 发明人 ASUNDI ANAND KRISHNA;PRIYADARSHI ANISH;MHAISALKAR SUBODH GAUTAM
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