发明名称 SELF-CALIBRATING TEMPERATURE PROBE
摘要 PROBLEM TO BE SOLVED: To accurately calibrate a probe for measuring the temperature of a substrate in a substrate processing chamber. SOLUTION: The probe includes a light pipe, one end of which is inserted into the processing chamber. The other end of the light pipe is connected to a bifurcated optical fiber. A light source is optically coupled to one branch of the optical fiber, and a pyrometer is optically coupled to another branch. To self-calibrate the probe, an object of stable reflectivity, such as a gold-plated wafer, is inserted into the chamber, the light source is activated, and the intensity of light reflected from the object is measured by the pyrometer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007108183(A) 申请公布日期 2007.04.26
申请号 JP20060286597 申请日期 2006.10.20
申请人 APPLIED MATERIALS INC 发明人 YAM MARK
分类号 G01D3/00;G01J5/00;G01J5/04;G01J5/08;G01J5/52;G01J5/54;G01J5/58;H01L21/205;H01L21/26 主分类号 G01D3/00
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