发明名称 THINNING AND DICING OF SEMICONDUCTOR WAFERS USING DRY ETCH, AND OBTAINING SEMICONDUCTOR CHIPS WITH ROUNDED BOTTOM EDGES AND CORNERS
摘要 A semiconductor wafer is diced before thinning. The wafer is diced only part of the way through, to form grooves which are at least as deep as the final thickness of each chip to be obtained from the wafer. Then, the wafer is placed into a non-contact wafer holder, and the wafer backside is blanket etched with a dry etch, for example, atmospheric pressure plasma etch. The wafer is thinned until the grooves are exposed from the backside. The dry etch leaves the chip's backside smooth. After the grooves have been exposed, the dry etch is continued to remove damage from the chip sidewalls and to round the chips' bottom edges and corners. As a result, the chip becomes more reliable, and in particular more resistant to thermal and other stresses.
申请公布号 EP1266399(A4) 申请公布日期 2007.04.25
申请号 EP20010906698 申请日期 2001.01.25
申请人 TRU-SI TECHNOLOGIES INC. 发明人 SINIAGUINE, OLEG;HALAHAN, PATRICK;SAVASTIOUK, SERGEY
分类号 H01L21/3065;H01L;H01L21/301;H01L21/44;H01L21/78;H01L23/02 主分类号 H01L21/3065
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