| 摘要 |
According to an aspect of the present invention, a method for correcting a defect in a pixel formed on an OLED substrate comprises following steps of: adjusting at least one among an incident angle of light, an intensity of light, and a wavelength of light to emit light from an optical source to a substrate; photographing the light reflected by a pixel formed on the substrate by using a camera to form an image; generating data on the intensity of the light reflected from the image; filtering the generated data; determining a pixel corresponding to remaining data after the filtering as defective; and spraying ink on the pixel, which is determined as defective, to correct the defect. According to the present invention, it is possible to determine a defect in a pixel and correct the defect quickly. |
