发明名称 Transmission electron microscope micro-grid
摘要 A transmission electron microscope micro-grid includes a carbon nanotube layer sandwiched between a first metal layer and a second metal layer. The carbon nanotube layer includes a first surface and a second surface opposite to each other, and the carbon nanotube layer comprises a number of carbon nanotubes. The first metal layer is attached on the first surface. The second metal layer is attached on the second surface. The first metal layer and the second metal layer are bonded with the carbon nanotube layer via a number of dangling bonds on the number of carbon nanotubes, the first metal layer defines a number of first through holes, the second metal layer defines a number of second through holes, and the carbon nanotube layer is exposed through the number of first through holes and the number of second through holes.
申请公布号 US9406481(B2) 申请公布日期 2016.08.02
申请号 US201514738952 申请日期 2015.06.15
申请人 Tsinghua University;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 Wei Yang;Lin Xiao-Yang;Fan Shou-Shan
分类号 H01J37/00;H01J37/20;H01J37/26;B82Y30/00 主分类号 H01J37/00
代理机构 ScienBiziP, P.C. 代理人 ScienBiziP, P.C.
主权项 1. A transmission electron microscope micro-grid comprising: a carbon nanotube layer comprising a first surface and a second surface opposite to the first surface, wherein the carbon nanotube layer comprises a plurality of carbon nanotubes; a first metal layer attached on the first surface; a second metal layer attached on the second surface; wherein the first metal layer and the second metal layer are bonded with the carbon nanotube layer via a plurality of dangling bonds on the plurality of carbon nanotubes, the first metal layer defines a plurality of first through holes, the second metal layer defines a plurality of second through holes, and the carbon nanotube layer is exposed through the plurality of first through holes and the plurality of second through holes.
地址 Beijing CN