发明名称 Attachment for ultrasonic probe, ultrasonic probe, electronic device, and ultrasonic diagnostic apparatus
摘要 An attachment for an ultrasonic probe is adapted to be mounted onto an ultrasonic probe body of the ultrasonic probe. The attachment for an ultrasonic probe includes a cover member and a protective member. The cover member is configured and arranged to cover an ultrasonic wave emission surface of a head section of the ultrasonic probe body when the attachment is mounted onto the ultrasonic probe body. The protective member is provided to a surface of the cover member facing the ultrasonic wave emission surface, and configured and arranged to be in contact with the ultrasonic wave emission surface when the attachment is mounted onto the ultrasonic probe body.
申请公布号 US9439626(B2) 申请公布日期 2016.09.13
申请号 US201314015043 申请日期 2013.08.30
申请人 Seiko Epson Corporation 发明人 Nakanishi Daisuke
分类号 A61B8/00;B06B3/00;B06B1/06 主分类号 A61B8/00
代理机构 Global IP Counselors, LLP 代理人 Global IP Counselors, LLP
主权项 1. An attachment for an ultrasonic probe adapted to be mounted onto an ultrasonic probe body of the ultrasonic probe, the attachment for an ultrasonic probe comprising: a cover member configured to cover an ultrasonic wave emission surface of a head section of the ultrasonic probe body when the attachment is mounted onto the ultrasonic probe body; a protective member disposed on an inner surface of the cover member facing the ultrasonic wave emission surface and configured to be in contact with the ultrasonic wave emission surface when the attachment is mounted onto the ultrasonic probe body; and a reflector that is arranged in the protective member such that the reflector is provided between the cover member and the ultrasonic wave emission source when the attachment is mounted onto the ultrasonic probe body, the reflector having an acoustic impedance greater than an acoustic impedance of the protective member, the inner surface of the cover member and the reflector being configured to reflect ultrasonic waves emitted from the ultrasonic wave emission surface to the ultrasonic wave emission surface such that the ultrasonic probe carries out an adjustment process to the ultrasonic probe body by using the ultrasonic waves that the inner surface of the cover member and the reflector have been reflected.
地址 Tokyo JP