| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device, capable of performing test verification, regardless of the storage state of memory. <P>SOLUTION: This semiconductor device 10 comprises a storage part 15 storing kill data, a mode selection part 16 selecting a general mode or kill mode based on the stored kill data, and a command control part 13 executing command processing in the selected general mode or kill mode. The command control part 13 is operated in the general mode based on disable signal. <P>COPYRIGHT: (C)2007,JPO&INPIT |
