发明名称 MINIMIZATION OF INTERFACIAL RESISTANCE ACROSS THERMOELECTRIC DEVICES BY SURFACE MODIFICATION OF THE THERMOELECTRIC MATERIAL
摘要 <p>A coating architecture (106, 206, 306) minimizing interfacial resistance across an interface (100, 200, 300) of a metal (104, 204, 304) and a semiconductor including at least two layers (108, 110, 112, 208, 210, 212, 306) intermediate the metal (104, 204, 304) and the semiconductor.</p>
申请公布号 WO2007040473(A1) 申请公布日期 2007.04.12
申请号 WO2005US33550 申请日期 2005.09.19
申请人 CARRIER CORPORATION;WILLIGAN, RHONDA, R.;JAWOROWSKI, MARK 发明人 WILLIGAN, RHONDA, R.;JAWOROWSKI, MARK
分类号 H01L21/4763 主分类号 H01L21/4763
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