发明名称 Method of improving etching profile of floating gates for flash memory devices
摘要 A method of forming floating gates for flash memory devices. A plurality of substrates is provided, in which a film to be etched and an overlying masking pattern layer are provided overlying each substrate. Each of the films in a plasma chamber is etched in sequence using the masking pattern layer as an etch mask, a polymer layer being deposited over the inner wall of the plasma chamber during the etching. An intermediary cleaning process is performed in the plasma chamber between the etchings before the deposited polymer layer reaches such a degree as to induce lateral etching on the next film to be etched, thereby improving etching profile of the films.
申请公布号 US7202170(B2) 申请公布日期 2007.04.10
申请号 US20040760995 申请日期 2004.01.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIU KUO-CHIN;LEU CHUNG-LONG;KE MEI-HOU
分类号 H01L21/302;H01L21/28;H01L21/3205;H01L27/11;H01L29/423 主分类号 H01L21/302
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