发明名称 SILVER SELENIDE FILM STOICHIOMETRY AND MORPHOLOGY CONTROL IN SPUTTER DEPOSITION
摘要 A method of sputter depositing silver selenide and controlling the stoichiometry and nodular defect formations of a sputter deposited silver-selenide film. The method includes depositing silver-selenide using a sputter deposition process at a pressure of about 0.3 mTorr to about 10 mTorr. In accordance with one aspect of the invention, an RF sputter deposition process may be used preferably at pressures of about 2 mTorr to about 3 mTorr. In accordance with another aspect of the invention, a pulse DC sputter deposition process may be used preferably at pressures of about 4 mTorr to about 5 mTorr.
申请公布号 KR20070038178(A) 申请公布日期 2007.04.09
申请号 KR20077006178 申请日期 2007.03.16
申请人 MICRON TECHNOLOGY, INC. 发明人 LI JIUTAO;HAMPTON KEITH;MCTEER ALLEN
分类号 C23C14/34;C23C14/00;C23C14/06;C23C14/54;C30B23/02;G11C11/34;H01L21/203 主分类号 C23C14/34
代理机构 代理人
主权项
地址