发明名称 PARTICLE PARAMETER MEASURING INSTRUMENT AND PARTICLE PARAMETER MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To simply and accurately measure the particle size or the speed of the particles in a non-visible region, such as the interior of piping or the like. SOLUTION: This particle parameter measuring instrument is equipped with an X-ray emitting source 11 for emitting X-rays of a single wavelength, mutually in parallel in a k (k≥4) row as an X-ray beam group B, an X-ray detector 12 having a detection surface in the emitting direction of the X-ray beam group B; an X-ray intensity distribution forming means 13 for forming an X-ray intensity distribution from the X rays detected by the X-ray detection 12; a peak detection means 14 for detecting two peaks from the X-ray intensity distribution; a peak detection and decision means 15 for deciding whether two peaks are detected by the peak detection means 14 and a peak width calculation means 16 for calculating the widths of two peaks as a particle size, when two peaks are decided as being detected by the peak detection and decision means 15. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007085732(A) 申请公布日期 2007.04.05
申请号 JP20050271180 申请日期 2005.09.16
申请人 TOSHIBA CORP 发明人 WATANABE KATSUNOBU;KOBAYASHI NORIYASU
分类号 G01N15/02;G01N23/201 主分类号 G01N15/02
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