发明名称 A STACKED TRANSISTOR HAVING A PROTRUDED IMPURITY REGION AND MANUFACTURING METHOD USING THE SAME
摘要 <p>Provided is a semiconductor device including a thin film transistor with at least one protruding impurity region and a method for manufacturing the same. The semiconductor device includes bulk transistors formed on a semiconductor substrate and an interlayer insulation layer covering the bulk transistor. At least one thin film transistor is formed on the interlayer insulation layer including impurity regions adjacent thereto. At least one impurity region of the thin film transistor protrudes higher than the other impurity region.</p>
申请公布号 KR100706807(B1) 申请公布日期 2007.04.05
申请号 KR20060010837 申请日期 2006.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SUNG JIN;PARK, SEUNG HYUN;KIM, SANG JONG;CHOI, RYU TAN
分类号 H01L29/786 主分类号 H01L29/786
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