发明名称 Plural treatment step process for treating dielectric films
摘要 A method and computer readable medium for treating a dielectric film on one or more substrates includes disposing the one or more substrates in a process chamber configured to perform plural treatment processes on a dielectric film. The dielectric film is formed on at least one of said one or more substrates, wherein the dielectric film includes an initial dielectric constant having a value less than the dielectric constant of SiO<SUB>2</SUB>. A thermal treatment process that includes annealing the one or more substrates is performed in order to remove volatile constituents from the dielectric film on the one or more substrates and a chemical treatment process is performed on the one or more substrates, including: introducing a treating compound to the dielectric film on the one or more substrates, and heating the one or more substrates.
申请公布号 US2007077781(A1) 申请公布日期 2007.04.05
申请号 US20050239291 申请日期 2005.09.30
申请人 TOKYO ELECTRON LIMTED 发明人 LEE ERIC M.;TOMA DOREL I.
分类号 H01L21/31;H01L21/20;H01L21/469 主分类号 H01L21/31
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