| 摘要 |
An apparatus for testing infrared cameras includes: a cover plate which has a plurality of holes formed therethrough and arranged in line in a horizontal direction at a regular interval, the cover plate being adapted to emit an amount of infrared light; and an emission source which is disposed in parallel to and behind the cover plate as viewed from infrared cameras to be tested, the emission source being adapted to emit a different amount of infrared light when compared with the cover plate. |
