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发明名称
Test element group structures having 3 dimensional SRAM cell transistors
摘要
申请公布号
KR100702008(B1)
申请公布日期
2007.03.30
申请号
KR20050007740
申请日期
2005.01.27
申请人
发明人
分类号
H01L27/11
主分类号
H01L27/11
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代理人
主权项
地址
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