发明名称 Semiconductor manufacturing device formed ceramic coating using Atomic Layer Deposition
摘要 A semiconductor manufacturing apparatus is provided to perform in-situ CLN without corrosion and crack of the surface of a metallic heater under a high temperature by forming a ceramic coating on the metallic heater using an ALD(Atomic Layer Deposition). A semiconductor manufacturing apparatus comprises a chamber(1), a metallic heater(2), a gas jet unit(3) for spraying a gas onto the metallic heater, a TMA(TriMethyl-Aluminium) pipeline(4) and an H2O pipeline(5) for supplying vaporized TMA and H2O to the metallic heater through the gas jet unit, a TMA removing unit(6) and an H2O removing unit(7) connected to the gas jet unit, a vacuum pump(8) for keeping an inner pressure of the chamber in a predetermined range, an N2 removing unit(9). A ceramic coating is formed on the metallic heater. The ceramic coating is formed by using an ALD.
申请公布号 KR100700639(B1) 申请公布日期 2007.03.28
申请号 KR20060050953 申请日期 2006.06.07
申请人 发明人
分类号 H01L21/205 主分类号 H01L21/205
代理机构 代理人
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