| 摘要 |
PROBLEM TO BE SOLVED: To provide an imaging system providing a detailed image of a sample, especially an image that shows areas of analyte crystals. SOLUTION: This system images the whole surface of an ion source sample plate lying outside an ion source. The system comprises: the ion source sample plate lying outside an ion source; an imaging apparatus that generates the image of the whole surface of the sample plate and is arranged separately from the sample plate; and an irradiation device that irradiates the surface, is close to the sample plate, and generates a light beam that comes into contact with the sample plate surface and forms an angle of elevation between it and the sample plate surface. COPYRIGHT: (C)2007,JPO&INPIT
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