发明名称 |
Method of manufacturing chemical mechanical polishing pad |
摘要 |
<p>The present invention relates to a method of manufacturing a chemical mechanical polishing pad which provides a chemical mechanical polishing pad which fully suppresses the occurrence of a scratch on the polished surface and has an excellent polishing rate. The method comprising either one of a group of steps
(A) and a group of steps (B), the group of steps (A) including (A1) the step of preparing a composition for forming a chemical mechanical polishing pad;
(A2) the step of molding the composition for forming a chemical mechanical polishing pad into a pad-like form; (A3) the sep of mounting the pad-like form on the round table of a cutting machine having at least a milling unit equipped with a milling cutter, a drive unit capable of angle indexing and positioning and a round table journaled by the drive unit; (A4) the step of forming the second group of grooves with the milling cutter; and
(A5) the step of forming the first group of grooves, and the group of steps (B) including
(B1) the step of preparing a composition for forming a chemical mechanical polishing pad;
(B2) the step of molding the composition for forming a chemical mechanical polishing pad into a pad-like form having the second group of grooves by using a metal mold having projections corresponding to the shapes of the second group of grooves; and
(B3) the step of forming the first group of grooves.</p> |
申请公布号 |
EP1764189(A1) |
申请公布日期 |
2007.03.21 |
申请号 |
EP20060120638 |
申请日期 |
2006.09.14 |
申请人 |
JSR CORPORATION |
发明人 |
HOSAKA, YUKIO;TANO, HIROYUKI;NISHIMURA, HIDEKI;SHIHO, HIROSHI |
分类号 |
B24D13/14;B23C3/30;B23C5/08;B23Q1/52;B24B37/20;B24D99/00;H01L21/304 |
主分类号 |
B24D13/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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