| 摘要 |
In an X-ray examination method, the tube voltage of an X-ray tube is set to a tube voltage that makes an X-ray absorptance difference between the first X-ray propagation medium and the second X-ray propagation medium with an X-ray absorbing power different from that of the first X-ray propagation medium in an object become not more than 10%, an X-ray beam is applied from the X-ray tube to the object while a tube voltage of the X-ray tube is set to the tube voltage, and a transmitted X-ray image is detected, which includes an X-ray refraction image formed in a region along a contour of a boundary surface between the first X-ray propagation medium and the second X-ray propagation medium by refraction of the X-ray beam by the boundary surface in superimposition on an X-ray absorption image reflecting the X-ray absorbing power difference between the first X-ray propagation medium and the second X-ray propagation medium.
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