发明名称 METHOD AND SYSTEM FOR MEASUREMENT UTILIZING ATTENUATION OF TOTAL REFLECTION
摘要 PROBLEM TO BE SOLVED: To improve throughput without spoiling measuring precision. SOLUTION: In the measuring method utilizing the attenuation of total reflection, the reaction on the sensor surface is measured by obtaining the measuring signal which fluctuates in the signal level corresponding to the light intensity. The sensor face is recovered by the cleansing process by sending the cleansing liquid after the reaction measuring process. During the cleansing process whether the sensor surface is recovered to the initial condition or not is discriminated by monitoring the measuring signal. When it is discriminated that the level of the measuring signal is recovered to the initial state, the cleansing process is terminated. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007064943(A) 申请公布日期 2007.03.15
申请号 JP20050255013 申请日期 2005.09.02
申请人 FUJIFILM CORP 发明人 MURAISHI KATSUAKI
分类号 G01N21/27;G01N33/543 主分类号 G01N21/27
代理机构 代理人
主权项
地址