发明名称 Capacitor structure, memory cell and method for forming a capacitor structure
摘要 The present invention refers to a trench capacitor structure as it is used in memory cells, for example in memory cells of memory devices. Particularly, the capacitor structure may be used in a DRAM memory. Furthermore, the invention relates to a memory cell comprising a transistor and a capacitor with a trench capacitor structure arranged in a semiconductor substrate. Furthermore, the invention relates to a DRAM comprising a memory cell with a transistor and a capacitor, whereby the capacitor comprises a trench capacitor structure. Moreover, the invention relates to a method for forming a capacitor structure in a semiconductor substrate.
申请公布号 US2007057304(A1) 申请公布日期 2007.03.15
申请号 US20050223145 申请日期 2005.09.12
申请人 INFINEON TECHNOLOGIES AG 发明人 BOESCKE TIM;GOLDBACH MATTHIAS
分类号 H01L29/94 主分类号 H01L29/94
代理机构 代理人
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