发明名称 Semiconductor FinFET structures with encapsulated gate electrodes and methods for forming such semiconductor FinFET structures
摘要 Semiconductor structures in which the gate electrode of a FinFET is masked from the process introducing dopant into the fin body of the FinFET to form source/drain regions and methods of fabricating such semiconductor structures. The gate doping, and hence the work function of the gate electrode, is advantageously isolated from the process that dopes the fin body to form the source/drain regions. The sidewalls of the gate electrode are covered by sidewall spacers that are formed on the gate electrode but not on the sidewall of the fin body.
申请公布号 US2007057325(A1) 申请公布日期 2007.03.15
申请号 US20050225654 申请日期 2005.09.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HSU LOUIS L.;MANDELMAN JACK A.
分类号 H01L27/12;H01L21/336 主分类号 H01L27/12
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