发明名称 SYSTEM AND METHOD FOR INTEGRATING MULTIPLE METAL GATES FOR CMOS APPLICATIONS
摘要 A dual-gate MOSFET with metal gates and a method for setting threshold voltage in such a MOSFET is provided. The method comprises: forming a gate oxide layer overlying first and second channel regions; forming a first metal layer having a first thickness overlying the gate oxide layer; forming a second metal layer having a second thickness overlying the first metal layer first thickness; selectively removing the second metal layer overlying the first channel region; forming a third metal layer; establishing a first MOSFET with a gate work function responsive to the thicknesses of the first and third metal layer overlying the first channel region; and, establishing a second MOSFET, complementary to the first MOSFET, with a gate work function responsive to the combination of the thicknesses of the first, second, and third metal layers overlying the second channel region.
申请公布号 KR100695640(B1) 申请公布日期 2007.03.15
申请号 KR20040013347 申请日期 2004.02.27
申请人 发明人
分类号 H01L21/28;H01L27/092;H01L21/336;H01L21/8238;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/28
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