发明名称 Automated atomic system testing
摘要 Atomic testing of a multiplicity of scenarios includes generating a listing of interacting scenarios which are likely to cause a failure, and testing ones of the scenarios not included in the listing according to a binary search strategy to identify a subset of the scenarios as a source of failure among the scenarios. Additionally, the listing can be updated with newly identified interacting scenarios which are likely to cause a failure.
申请公布号 US2007061624(A1) 申请公布日期 2007.03.15
申请号 US20050225360 申请日期 2005.09.13
申请人 APOSTOLOIU LAURA I;DAY PHILIP A;GHAZIZADEH BEHRAD 发明人 APOSTOLOIU LAURA I.;DAY PHILIP A.;GHAZIZADEH BEHRAD
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
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