发明名称 |
SYSTEM FOR ESTIMATING ATTITUDE AT SPECIFIC PART, METHODE FOR ESTIMATING ATTITUDE AT SPECIFIC PART, AND PROGRAM FOR ESTIMATING ATTITUDE AT SPECIFIC PART |
摘要 |
An attitude estimating system for detecting the attitude in a short time without being affected by the brightness of an input image even with a small-scale hardware of low calculation capacity. The attitude estimating system comprises a matching image generating section (3) for binarizing each pixel of an input image extracting a specified part with a set threshold value based on an image value within a specified coordinate range and obtaining a binary image by further specifying a component having a size within a set range, and a pattern matching section (4) for detecting the attitude by collating the binary image obtained by specifying a component with a specified template. ® KIPO & WIPO 2007 |
申请公布号 |
KR20070029666(A) |
申请公布日期 |
2007.03.14 |
申请号 |
KR20067017711 |
申请日期 |
2006.08.31 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
TANAKA SHOJI |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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