发明名称 SYSTEM FOR ESTIMATING ATTITUDE AT SPECIFIC PART, METHODE FOR ESTIMATING ATTITUDE AT SPECIFIC PART, AND PROGRAM FOR ESTIMATING ATTITUDE AT SPECIFIC PART
摘要 An attitude estimating system for detecting the attitude in a short time without being affected by the brightness of an input image even with a small-scale hardware of low calculation capacity. The attitude estimating system comprises a matching image generating section (3) for binarizing each pixel of an input image extracting a specified part with a set threshold value based on an image value within a specified coordinate range and obtaining a binary image by further specifying a component having a size within a set range, and a pattern matching section (4) for detecting the attitude by collating the binary image obtained by specifying a component with a specified template. ® KIPO & WIPO 2007
申请公布号 KR20070029666(A) 申请公布日期 2007.03.14
申请号 KR20067017711 申请日期 2006.08.31
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 TANAKA SHOJI
分类号 G06T7/00 主分类号 G06T7/00
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