发明名称 |
CHEMICAL MECHANICAL POLISHING APPARATUS |
摘要 |
Chemical mechanical polishing equipment is provided to prevent contamination due to a polishing liquid and a polishing byproduct and degradation of a semiconductor by using a platen with a sloping surface whose outer side edge of the platen is lower than an inner side thereof. A platen(101) has a mounting surface where a polishing pad is mounted. A polishing supplying unit(301) supplies a polishing liquid to the polishing pad. A polishing head(401) supports a semiconductor wafer(W). The polishing head pressurizes and rotates the semiconductor wafer on the polishing pad. A container(701) is arranged to surround the polishing pad. An outer side edge of the platen is lower than an inner side thereof. An edge of the platen had a sloping surface. The edge of the platen has a rounded surface. The edge of the platen is a step type.
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申请公布号 |
KR20070027294(A) |
申请公布日期 |
2007.03.09 |
申请号 |
KR20050082748 |
申请日期 |
2005.09.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RYU, JUN GYU |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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