发明名称 METHOD AND CIRCUIT FOR MEASURING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To prevent the number of power sources and the number of tester measuring terminals required for inspection from depending on a simultaneous measurement number when the inspection is performed by simultaneous measurement; and to increase the simultaneous measurement number. SOLUTION: Switch devices 111-113 are disposed between shared power sources 100 and each of devices 1-3 to share the power sources required for inspection, a primary inspection is performed for determining whether an LSI device of a measured object has an adverse effect on the inspection, possibility of connection of the shared power sources is controlled based on a result of the primary inspection, and a secondary inspection as a normal inspection is applied to the LSI device connected to the shared power source. A shared measuring circuit of the tester measuring terminals constituted by a timing adjusting circuit and an output shared circuit is disposed on an input/output side to share the tester measuring terminals required for inspection, thereby determining goodness/badness of an input device and each device by sharing the tester measuring terminals. The circuit and method enable inspection without making the number of power sources and the number of tester measuring terminals depend on the simultaneous measurement number. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007057401(A) 申请公布日期 2007.03.08
申请号 JP20050243630 申请日期 2005.08.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUGIMURA YUKIO;SHINOMIYA SHIGERU;KATO YASUMITSU
分类号 G01R31/28 主分类号 G01R31/28
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