The invention relates to a particulate contaminant removal device (1), which may be adapted to a number of closed chambers and permits the surface collection of contaminants and/or pollutants present in the atmosphere of the chamber. This mode of removal provides specific information on the behaviour thereof. In particular the removal device (1) comprises a support (2) on which substrates (6) may be positioned for the collection of samples. The device (1) is embodied to isolate the taken samples until arrival at the point of analysis in order to improve the specificity of measurements.
申请公布号
WO2006117494(A3)
申请公布日期
2007.03.08
申请号
WO2006FR50400
申请日期
2006.04.28
申请人
COMMISSARIAT A L'ENERGIE ATOMIQUE;TOVENA-PECAULT, ISABELLE;MANAC'H, PATRICK;PALMIER, STEPHANIE