发明名称 FILM MEASURING APPARATUS AND METHOD, COATING APPARATUS HAVING FILM MEASURING APPARATUS AND COATING METHOD USING FILM MEASURING METHOD
摘要 A film measuring apparatus and a method, a coating apparatus having a film measuring apparatus and a coating method using a film measuring method are provided to automatically control coating quantity of an object to be measured according to measured thickness and easily detect a defective part of a film. An apparatus for measuring physical quantity of an object coated or laminated on a film or a sheet includes a capturing unit to convert a color tone of a color image obtained by capturing a film into gradation data of respective color components, a table(13) to accommodate reference values of the physical quantity of the film corresponding to respective measured gray levels with respect to at least one color component, and a processing unit(14) to index the gradation data of at least one color component among the gradation data of the respective color components and to obtain the physical quantity of the object with reference to the reference values of the physical quantity accommodated in the table. The quantity of the film is the thickness of the film, and the table accommodates reference values of the film thickness corresponding to the respective pre-measured gray levels. The physical quantity of the film is weight per unit area, and the table accommodates reference values of the weight corresponding to the respective pre-measured gray levels.
申请公布号 KR20070026204(A) 申请公布日期 2007.03.08
申请号 KR20060083593 申请日期 2006.08.31
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HAYASHI TETSUYA;FUJIKAWA MASATO;TERAMOTO KAZUTAKA
分类号 G01N21/88;G01B11/06 主分类号 G01N21/88
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