发明名称 PARTICLE MEASURING INSTRUMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To optically measure diffusion information on charged particles without labeling them. <P>SOLUTION: This particle measuring instrument is equipped with: a diffraction grating 11a formed at a position adjoining a liquid specimen in a cell 10 for producing a basic diffracted light pattern when it is illuminated with light from a light source; an electrode 11a constituting part of the diffraction grating; an impressed voltage control part 22a for changing particle distribution by impressing a voltage on the electrode to produce a derivative diffracted light pattern different from the basic diffracted light pattern while vanishing the derivative diffracted light pattern by stopping impression of voltage; a light detector 18 for detecting derivative diffracted light of part of the derivative diffracted light pattern; and a signal analysis part for analyzing diffusion information on particles based on a signal change accompanying the production and vanishment of the derivative diffracted light detected by the light detector 18. The control part 22a performs diffusion measurement while preventing charged particles from clustering by impressing thereon a voltage obtained by superposing an AC voltage on a DC voltage. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007057293(A) 申请公布日期 2007.03.08
申请号 JP20050240793 申请日期 2005.08.23
申请人 SHIMADZU CORP 发明人 WADA YUKIHISA;MORIYA NAOJI;NAGUMO YUZO
分类号 G01N15/02 主分类号 G01N15/02
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