发明名称 METHOD AND DEVICE FOR GENERATING TEMPERATURE COMPENSATED READING/VERIFYING OPERATION IN FLASH MEMORY
摘要 <p><P>PROBLEM TO BE SOLVED: To compensate temperature variation which may be caused in an operation period of a semiconductor memory. <P>SOLUTION: A method and a device for generating word line voltage are disclosed. A word line voltage generator has a first current source, an adjustable current source, an adjustable current sink and a voltage transducer and they are connected to a current adding node. The first current source generates first current having a temperature coefficient equal to a temperature coefficient of at least one bit cell. The adjustable current source generates a second current independent of temperature variation. The adjustable current sink generates a third current independent of the temperature variation. A reference current includes (the first current + the second current) - the third current. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007059024(A) 申请公布日期 2007.03.08
申请号 JP20050246241 申请日期 2005.08.26
申请人 MICRON TECHNOL INC 发明人 TANZAWA TORU
分类号 G11C16/06;G11C16/02 主分类号 G11C16/06
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