发明名称 METHOD FOR MEASURING THICKNESS OF SHEET-LIKE OBJECT AND APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for measuring a thickness of a sheet-like object, which precisely measures the thickness of the sheet-like object. SOLUTION: An X-ray tube unit 2 which is composed of a plurality of X-ray tubes 8 arranged annularly at a prescribed pitch P, and an X-ray detecting unit 4 which is composed of a plurality of X-ray detectors 9 arranged annularly so as to be opposite to the X-ray tubes 8, are rotated in synchronization with each other in their opposite state while sandwiching the sheet-like object 1, whereby the thickness of the sheet-like object 1 is measured, and a thickness of a calibration-use reference body 6 is measured at an orbit deviating from the sheet-like object. The thickness of the reference body 6 is compared with a reference value by a compensation operating section 12 in order to obtain a compensation value, and the measured thickness of the sheet-like object 1 is compensated by reflecting the compensation value. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007057359(A) 申请公布日期 2007.03.08
申请号 JP20050242596 申请日期 2005.08.24
申请人 NITTO DENKO CORP 发明人 KAI MAKOTO
分类号 G01B15/02 主分类号 G01B15/02
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