发明名称 Timing verification method for semiconductor integrated circuit
摘要 Initially, non-uniformity of statistical skews between a plurality of clock output terminal pairs is calculated. Next, a partial circuit driven by a clock output terminal pair having each skew distribution is extracted from an integrated circuit. Next, a second statistical timing characteristic which is a maximum value in the partial circuit is obtained from a first statistical timing characteristic of signal paths included in the extracted partial circuit. Next, timing verification for the integrated circuit is performed using the second statistical timing characteristics corresponding to the respective statistical clock skews.
申请公布号 US2007050742(A1) 申请公布日期 2007.03.01
申请号 US20060495778 申请日期 2006.07.31
申请人 YONEZAWA HIROKAZU 发明人 YONEZAWA HIROKAZU
分类号 G06F17/50 主分类号 G06F17/50
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