摘要 |
The present invention provides atomic layer deposition systems and methods that include at least one compound of the formula (Formula I): Ta(NR<SUP>1</SUP>)(NR<SUP>2</SUP>R<SUP>3</SUP>)<SUB>3</SUB>, wherein each R<SUP>1</SUP>, R<SUP>2</SUP>, and R<SUP>3 </SUP>is independently hydrogen or an organic group, with the proviso that at least one of R<SUP>1</SUP>, R<SUP>2</SUP>, and R<SUP>3 </SUP>is a silicon-containing organic group. Such systems and methods can be useful for depositing tantalum silicon nitride layers on substrates.
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