发明名称 |
SOLID-STATE IMAGER AND FORMATION METHOD USING ANTI-REFLECTIVE FILM FOR OPTICAL CROSSTALK REDUCTION |
摘要 |
<p>Conductive lines in an imaging device are coated with an anti-reflective film to reduce crosstalk caused by light reflecting from the conductive lines. An interface results between the anti-reflective film and the surface of the conductive line surface. A second interface exists between the anti-reflective film and an overlying insulating layer. The anti-reflective film is formed from a material having a complex refractive index such that reflectance is reduced at each of the two interfaces. The anti-reflective film also can be light absorbing to provide further reductions in light reflection and consequent crosstalk.</p> |
申请公布号 |
WO2007025102(A2) |
申请公布日期 |
2007.03.01 |
申请号 |
WO2006US33175 |
申请日期 |
2006.08.24 |
申请人 |
MICRON TECHNOLOGY, INC.;LI, JIUTAO |
发明人 |
LI, JIUTAO |
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