发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device including a Schottky electrode formed thereon without causing the increase of the number of manufacturing processes, and also to provide its manufacturing method. SOLUTION: The semiconductor device comprises: a gate insulating film 16 provided on a semiconductor layer 10; a gate electrode 9 provided on the gate insulating film 16 and having at least one opening 8 between adjacent well regions 13; a source electrode 19 in ohmic contact with the source region 15; and a drain electrode 18 provided on the rear surface of the semiconductor substrate 11. An interlayer insulating film 7 is formed on the gate electrode 9 and the source electrode 19, and upper wiring 6 connected to the source electrode 19 is formed on the interlayer insulating film 7. The interlayer insulating film 7 has a contact hole 8' that reaches the surface of a drift region 12 passing through the interior of the opening 8 in the gate electrode 9, and part of the upper wiring 6 makes contact with the surface of the drift region 12 via the contact hole 8' to serve as a Schottky electrode. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007053226(A) |
申请公布日期 |
2007.03.01 |
申请号 |
JP20050237182 |
申请日期 |
2005.08.18 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KUSUMOTO OSAMU;UCHIDA MASAO;KITAHATA MAKOTO;YAMASHITA MASAYA |
分类号 |
H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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