发明名称 Method of forming silicon-on-insulator (SOI) semiconductor substrate and SOI semiconductor substrate formed thereby
摘要 A method of forming an SOI semiconductor substrate and the SOI semiconductor substrate formed thereby, is provided. The method includes forming sequentially buried oxide, diffusion barrier and SOI layers on a semiconductor substrate. The diffusion barrier layer is formed by an insulating layer having a lower impurity diffusion coefficient as compared with the buried oxide layer. The diffusion barrier layer serves to prevent impurities implanted into the SOI layer from being diffused into the buried oxide layer or the semiconductor substrate.
申请公布号 US7183172(B2) 申请公布日期 2007.02.27
申请号 US20030397447 申请日期 2003.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JUNG-IL;BAE GEUM-JONG;KIM KI-CHUL;RHEE HWA-SUNG;KIM SANG-SU
分类号 H01L21/76;H01L21/02;H01L21/762;H01L27/12 主分类号 H01L21/76
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