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经营范围
发明名称
Probe card
摘要
A probe card includes a base that supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal in on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chips.
申请公布号
US7183763(B1)
申请公布日期
2007.02.27
申请号
US20060374023
申请日期
2006.03.14
申请人
FUJITSU LIMITED
发明人
MURATA HISANORI
分类号
G01R33/12
主分类号
G01R33/12
代理机构
代理人
主权项
地址
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