发明名称 Shadow mask and method for producing a shadow mask
摘要 The disclosed device is directed towards a shadow mask for ion beams comprising a silicon wafer with a hole pattern arranged therein, wherein the silicon wafer is provided at a side confronting the incident ion beams with a metallic coating which stops the ion beams and dissipates heat, wherein an apertured region of the silicon wafer has a thickness from about 20 mum to about 200 mum and apertures in the shadow mask have lateral dimensions from about 0.5 mum to about 3 mum.
申请公布号 US7183043(B2) 申请公布日期 2007.02.27
申请号 US20030344710 申请日期 2003.10.10
申请人 UNIVERSITAT KASSEL 发明人 MEIJER JAN;STEPHAN ANDREAS;WEIDENMULLER ULF;RANGELOW IVO
分类号 G03C5/00;G03F1/00;G03F1/20 主分类号 G03C5/00
代理机构 代理人
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