发明名称 SCANNING LASER MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To attain highly accurate observation by easily correcting positional deviation between laser light for observation and stimulating laser light caused when optical components are switched or replaced to or with another one. SOLUTION: The scanning laser microscope 1 includes; a laser light source 2 for observation for emitting the laser light L<SB>1</SB>for observation; a first optical scanning apparatus 3 for two-dimensionally scanning a sample A with the laser light L<SB>1</SB>through an objective lens 10; detection optical systems 12 and 13 for detecting the light F emitted from the sample A irradiated with the laser light L<SB>1</SB>; a stimulating laser light source 4 for emitting the stimulating laser light L<SB>2</SB>; a second optical scanning apparatus 5 for two-dimensionally scanning the sample A with the stimulating laser light L<SB>2</SB>through the objective lens 10; a spot position detecting means 14 for detecting the position of a spot light formed by the laser light L<SB>1</SB>and the stimulating laser light L<SB>2</SB>; and a correcting means 15 for correcting the detected position of the spot light formed by the laser light L<SB>1</SB>and the stimulating laser light L<SB>2</SB>. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007047465(A) 申请公布日期 2007.02.22
申请号 JP20050232011 申请日期 2005.08.10
申请人 OLYMPUS CORP 发明人 SASAKI HIROSHI;NAKADA TATSUO
分类号 G02B21/00 主分类号 G02B21/00
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