发明名称 |
FAILURE ANALYSIS SYSTEM, FAILURE ANALYSIS INFORMATION PROCESSING DEVICE AND FAILURE ANALYSIS METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a failure analysis system independent of a format of test data processable by a failure analysis device, capable of suppressing the number of information files used for failure analysis; and also to provide a failure analysis information processing device and a failure analysis method. SOLUTION: This system is equipped with: a parser part 211 for classifying information included in test data for a test to be applied to the test of an LSI which is a failure analysis object in each kind and generating intermediate data; a fail information addition part 212 for adding fail information acquired from the LSI test using the test data for the test to the intermediate data; a test data generation part 213 for generating test data for the failure analysis based on the intermediate data to which the fail information is added; and a fail information generation part 214 for generating fail information for the failure analysis based on the intermediate data to which the fail information is added. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007047109(A) |
申请公布日期 |
2007.02.22 |
申请号 |
JP20050234204 |
申请日期 |
2005.08.12 |
申请人 |
TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP |
发明人 |
KAMITOSA YASUSHI;FUJII MITSUO;KAMATA TADASHI;TAKANO TAKAYUKI |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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