发明名称 FAILURE ANALYSIS SYSTEM, FAILURE ANALYSIS INFORMATION PROCESSING DEVICE AND FAILURE ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a failure analysis system independent of a format of test data processable by a failure analysis device, capable of suppressing the number of information files used for failure analysis; and also to provide a failure analysis information processing device and a failure analysis method. SOLUTION: This system is equipped with: a parser part 211 for classifying information included in test data for a test to be applied to the test of an LSI which is a failure analysis object in each kind and generating intermediate data; a fail information addition part 212 for adding fail information acquired from the LSI test using the test data for the test to the intermediate data; a test data generation part 213 for generating test data for the failure analysis based on the intermediate data to which the fail information is added; and a fail information generation part 214 for generating fail information for the failure analysis based on the intermediate data to which the fail information is added. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007047109(A) 申请公布日期 2007.02.22
申请号 JP20050234204 申请日期 2005.08.12
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 KAMITOSA YASUSHI;FUJII MITSUO;KAMATA TADASHI;TAKANO TAKAYUKI
分类号 G01R31/28 主分类号 G01R31/28
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