发明名称 MANUFACTURING METHOD AND MANUFACTURING DEVICE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method and a manufacturing device of a semiconductor device capable of performing treatment with precision and high quality. SOLUTION: The method for manufacturing the semiconductor device is one that treats a processed object while heating it, and provided with a low temperature area temperature-raising step (S200) that heats a substrate 24 while measuring the temperature of the substrate 24 that should compose the semiconductor device with a pyrometer 27, a high temperature area temperature-raising step (S400) that switches a member to measure the temperature 24 from the pyrometer 27 to a radiation thermometer 22 when the temperature of the substrate 24 reaches a reference temperature, a high temperature area temperature-raising step (S400) that heats the substrate 24 by a treatment temperature while measuring the temperature of the substrate 24 by the radiation thermometer 22, and a deposition treatment step (S500) that treats the substrate 24 at such a temperature as the substrate 24 should be treated. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007049078(A) 申请公布日期 2007.02.22
申请号 JP20050234442 申请日期 2005.08.12
申请人 SUMITOMO ELECTRIC IND LTD 发明人 YOSHIMOTO SUSUMU;UENO MASANORI
分类号 H01L21/205 主分类号 H01L21/205
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