发明名称 ELECTRON BEAM POSITION FLUCTUATION MEASUREMENT METHOD, ELECTRON BEAM POSITION FLUCTUATION MEASUREMENT DEVICE, AND ELECTRON BEAM RECORDING DEVICE
摘要 <p>It is an object of the present invention to make it possible to stably and correctly measure a changing amount of a beam position when a beam displacement is measured prior to a recording operation performed by an electron beam recording apparatus. A measuring device 10 for measuring a displacement of an electron beam E P prior to a recording operation, comprises: a knife edge 11 disposed at an irradiating position of the beam spot E P ; detecting means (Farady cup 12 or the like) for detecting an electron beam E irradiating through the knife edge 11; filter means (high frequency cut filter 14 or the like) for removing a changing frequency component of measurement subj ect from an output of the detecting means; and control means 15 for controlling a reference position of the electron beam E in accordance with an output from the filter means, in a manner such that the center of the beam spot E P will be at the front end position of the knife edge 11. A displacement of the beam spot E P is measured in accordance with an output change of the detecting means when the center of the beam spot E P deviates from the front end of the knife edge 11.</p>
申请公布号 EP1755001(A1) 申请公布日期 2007.02.21
申请号 EP20050745969 申请日期 2005.06.02
申请人 PIONEER DESIGN CORPORATION 发明人 KOJIMA, YOSHIAKI
分类号 G03F7/20;G11B7/26;G11B9/10;H01J37/04;H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址