TEST METHOD AND TEST DEVICE FOR TESTING AN INTEGRATED CIRCUIT,申请号EP20050752747-传众专利搜索

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发明名称	TEST METHOD AND TEST DEVICE FOR TESTING AN INTEGRATED CIRCUIT
摘要
申请公布号	EP1754075(A1)	申请公布日期	2007.02.21
申请号	EP20050752747	申请日期	2005.05.24
申请人	SIEMENS AKTIENGESELLSCHAFT	发明人	BUCHNER, REINHARD;EBNER, CHRISTIAN;MOSEL, STEFAN;RAUSCHER, PETER;VOIGTLAENDER, ARNDT
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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