发明名称 Method for reading non-volatile memory cells
摘要 <p>A method includes changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes determining a history read reference level of a group of history cells associated with a group of memory cells of a non-volatile memory cell array, allowing correct reading of the group of history cells, selecting a memory read reference level according to the first read reference level, and reading the non-volatile memory array cells.</p>
申请公布号 EP1755128(A2) 申请公布日期 2007.02.21
申请号 EP20060118948 申请日期 2006.08.15
申请人 SAIFUN SEMICONDUCTORS LTD. 发明人 SHAPPIR, ASSAF;COHEN, GUY;LUSKY, ELI
分类号 G11C16/26 主分类号 G11C16/26
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