发明名称 Chemically amplified positive resist composition and patterning process
摘要 A chemically amplified positive resist composition comprising a specific 2,4,6-triisopropylbenzenesulfonate compound as a photoacid generator, a polymer which changes its solubility in an alkaline developer under the action of acid, and a basic compound has a high sensitivity, a high contrast of dissolution of resist film, a high resolution, and good storage stability.
申请公布号 US2007037091(A1) 申请公布日期 2007.02.15
申请号 US20060583041 申请日期 2006.10.19
申请人 KOITABASHI RYUJI;WATANABE SATOSHI;OHSAWA YOUICHI 发明人 KOITABASHI RYUJI;WATANABE SATOSHI;OHSAWA YOUICHI
分类号 G03C1/00;G03F7/004;C08F212/14;C08F220/10;G03C1/492;G03F7/039;H01L21/027 主分类号 G03C1/00
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