| 摘要 |
The arrangement for examining microscope preparations with a scanning microscope comprises a laser ( 1 ) and an optical means ( 12 ) which images the light generated by the laser ( 1 ) onto a specimen ( 13 ) that is to be examined. Provided between the laser ( 1 ) and the optical means ( 12 ) is an optical component ( 3, 20 ) that spectrally spreads, with a single pass, the light generated by the laser ( 1 ). The optical component ( 3, 20 ) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber ( 20 ).
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